This inventor holds 1 USPTO granted patent. Top assignee: Asml Masktools B.v.. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Jungchul Park: Innovator in Optical Proximity Correction
Introduction
Jungchul Park is a notable inventor based in Pleasanton, CA (US). He has made significant contributions to the field of optical proximity correction (OPC) through his innovative methods and apparatus. His work is essential for enhancing the accuracy of circuit pattern imaging in semiconductor manufacturing.
Latest Patents
Jungchul Park holds a patent titled "Method and apparatus for performing model-based OPC for pattern decomposed features." This patent describes a method for decomposing a target circuit pattern containing features to be imaged into multiple patterns. The process involves separating the features into a first and second pattern, performing optical proximity correction processes, and adjusting the patterns based on imaging performance errors. This innovative approach significantly improves the accuracy of circuit pattern imaging.
Career Highlights
Jungchul Park is currently employed at ASML Masktools B.V., where he continues to develop advanced technologies in the semiconductor industry. His expertise in optical proximity correction has positioned him as a key player in enhancing imaging techniques for complex circuit designs.
Collaborations
Throughout his career, Jungchul Park has collaborated with talented professionals, including Jang Fung Chen and Duan-Fu Stephen Hsu. These collaborations have fostered innovation and contributed to the advancement of optical proximity correction technologies.
Conclusion
Jungchul Park's contributions to the field of optical proximity correction demonstrate his commitment to innovation and excellence in semiconductor technology. His patent and ongoing work at ASML Masktools B.V. highlight his role as a leading inventor in this critical area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
