Yongin, South Korea

Jung Yoon Shin

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Cymer, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung Yoon Shin. Retrieved from https://idiyas.com/inventor/jung-yoon-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jung Yoon Shin and Optical-Source Prediction

Introduction

Jung Yoon Shin is an inventor associated with Yongin, South Korea, and Cymer, Inc. His patent work concerns predicting the firing pattern of an optical source used in photolithography. The available information lists 1 patent associated with him.

Latest Patents

“Prediction Apparatus and Method for Optical Source” describes an apparatus that communicates with an optical source producing a pulsed light beam for a photolithography exposure system. A photolithography module receives an identifier that does not contain data about the actual firing pattern. An optical-source module uses that identifier to provide a forecast firing pattern, predicting one or more properties of the actual pattern.

Career Highlights

Shin’s listed invention addresses coordination between photolithography equipment and its optical source. By forecasting properties of a firing pattern from an identifier, the apparatus is designed to provide the optical source with a predicted pattern for use in the exposure process.

Collaborations

Shin is associated with Cymer, Inc. His listed coworker is Russell Allen Burdt.

Conclusion

Jung Yoon Shin’s patent reflects work on forecasting optical-source firing patterns for photolithography, connecting equipment identifiers with predicted operating behavior.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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