Jung Hwan Shin

Title: Innovations by Jung Hwan Shin in Dementia Diagnosis

Introduction

Jung Hwan Shin is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of medical technology, particularly in the diagnosis of dementia with Lewy bodies.

Latest Patents

Jung Hwan Shin holds a patent for an electronic device and method for diagnosing dementia with Lewy bodies or predicting morbidity to dementia with Lewy bodies. The invention includes a processor that measures cortical thicknesses for various regions of the brain using brain MRI images from both a normal group and a DLB patient group. It generates a DLB pattern matrix based on the differences in average cortical thickness and applies this to calculate a first DLB pattern score. This score is then used to diagnose the subject as having DLB or to predict morbidity related to DLB.

Career Highlights

Jung Hwan Shin is affiliated with Seoul National University, where he continues to advance research in the field of dementia diagnosis. His work is pivotal in developing innovative solutions that enhance the accuracy of diagnosing complex neurological conditions.

Collaborations

He collaborates with esteemed colleagues, including Jee Young Lee and Hee Jung Kim, to further his research and development efforts.

Conclusion

Jung Hwan Shin's innovative work in the diagnosis of dementia with Lewy bodies exemplifies the intersection of technology and healthcare. His contributions are vital in improving diagnostic methods and ultimately enhancing patient care.