The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Sep. 28, 2023
Applicant:

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Je Hee Lee, Seoul, KR;

Beom Seok Jeon, Seoul, KR;

Jung Hwan Shin, Seoul, KR;

Ri Yu, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/20 (2022.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06V 40/25 (2022.01); G06T 7/73 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/30196 (2013.01);
Abstract

A gait analysis method includes collecting a two-dimensional gait video of a subject's gait situation during a preset time, which is captured using a camera; generating a three-dimensional coordinate system based on at least one frame of the two-dimensional gait video by receiving three-dimensional information of a capturing space; calculating three-dimensional feature point coordinates by receiving a plurality of feature points on the three-dimensional coordinate system, and calculating two-dimensional feature point coordinates for the plurality of feature points using resolution information of the camera; estimating mapping information between the three-dimensional feature point coordinates and the two-dimensional feature point coordinates; calculating a plurality of two-dimensional joint position information for the subject from the two-dimensional gait video; calculating a plurality of three-dimensional joint position information corresponding to the plurality of two-dimensional joint position information; and calculating gait parameters for the subject using the three-dimensional joint position information.


Find Patent Forward Citations

Lee, Je. (2026). Gait analysis apparatus and method (U.S. Patent No. 12597292). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12597292

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