This inventor holds 3 USPTO granted patents. Top assignees: Toyota Jidosha Kabushiki Kaisha, Aisin Seiki Kabushiki Kaisha. Active years: 2013-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Anjo, JP (2013)
- Nagoya, JP (2017 - 2021)
Company Filing History:


Years Active: 2013-2021
Title: Jun Takayanagi: Innovator in Film Thickness Measurement
Introduction
Jun Takayanagi is a notable inventor based in Nagoya, Japan. He has made significant contributions to the field of film thickness measurement, holding a total of 3 patents. His work focuses on advanced methods and devices that enhance the accuracy and efficiency of measuring film thickness in various applications.
Latest Patents
Takayanagi's latest patents include a film thickness measuring method and a film thickness measuring apparatus. The film thickness measuring apparatus features a displacement sensor and a film thickness calculator that consists of three processors. The displacement sensor detects the displacement of a sheet in its thickness direction, while the first processor determines the speed of this displacement. The second processor corrects the scan waveform acquired by a terahertz scanner, and the third processor calculates the thickness of the film based on the intensity peaks of the terahertz wave. Another patent involves a film thickness measuring device that includes a terahertz wave generator, a prism, and a terahertz wave detector. This device determines the thickness of a film based on the difference between the time waveforms of S-polarization and P-polarization components of the reflected wave.
Career Highlights
Throughout his career, Jun Takayanagi has worked with prominent companies such as Toyota Motor Corporation and Aisin Seiki Co., Ltd. His experience in these organizations has contributed to his expertise in the field of film thickness measurement.
Collaborations
Takayanagi has collaborated with notable coworkers, including Hideyuki Ohtake and Masanori Miura. Their combined efforts have further advanced the innovations in film thickness measurement technology.
Conclusion
Jun Takayanagi's contributions to the field of film thickness measurement through his patents and collaborations highlight his role as an influential inventor. His work continues to impact various industries that rely on precise film thickness measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile