Fukui, Japan

Jun Nishikawa


Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2010-2014

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4 patents (USPTO):Explore Patents

Title: Jun Nishikawa: Innovator in Electronic Device Technology

Introduction

Jun Nishikawa is a prominent inventor based in Fukui, Japan. She has made significant contributions to the field of electronic devices, holding a total of 4 patents. Her work focuses on enhancing the reliability and performance of electronic components.

Latest Patents

One of her latest patents is an electronic device and method for manufacturing the same. This invention addresses critical issues such as preventing the entry of plating solutions and moisture into electronic devices. It also eliminates soldering defects and solder popping defects caused by glass precipitation on external electrodes. The innovative electrode structure consists of Cu-baked electrode layers primarily composed of copper, along with Cu plating layers that undergo recrystallization treatment. Additionally, upper-side plating layers are formed on the Cu plating layers. A specific heat treatment is applied to ensure the optimal recrystallization of the Cu plating layers without softening the glass in the conductive paste.

Career Highlights

Jun Nishikawa is currently employed at Murata Manufacturing Co., Ltd., a leading company in the electronics industry. Her work has significantly impacted the development of reliable electronic devices, showcasing her expertise and dedication to innovation.

Collaborations

Throughout her career, Jun has collaborated with notable colleagues, including Hiroshi Katsube and Akihiro Motoki. These collaborations have further enriched her work and contributed to the advancement of electronic device technology.

Conclusion

Jun Nishikawa is a remarkable inventor whose contributions to electronic device technology have made a lasting impact. Her innovative patents and collaborations highlight her commitment to enhancing the reliability and performance of electronic components.

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