Company Filing History:
Years Active: 2007-2011
Title: Innovations by Jun Kuriyama: Pioneering Inspection Technologies
Introduction
Jun Kuriyama is a distinguished inventor hailing from Fukuchiyama, Japan. With a remarkable track record of four patents, she has significantly contributed to advancements in inspection technologies used in various manufacturing processes. As an inventor at Omron Corporation, she has developed innovative solutions that enhance the quality control of substrates during production.
Latest Patents
Among her latest patents, Kuriyama has introduced groundbreaking methods and apparatus for inspecting substrates. One of her notable inventions entails an inspection apparatus designed to assess a substrate during critical stages of the soldering process. This technology captures images of the substrate before and after key production phases, such as component mounting and soldering, allowing for a comparative analysis of any differences. Through sophisticated differentiation and binarization processes, Kuriyama's method identifies individual components, and establishes specific conditions for inspecting substrate quality based on the gathered image data.
Additionally, she holds a patent for a surface inspection method that utilizes red, green, and blue light beams at various elevation angles to scrutinize a target object's surface condition. By evaluating the shift in color phase that occurs due to specific light arrangements, this innovative approach provides a reliable assessment of surface conditions, thereby ensuring higher standards of quality in manufacturing.
Career Highlights
Throughout her career at Omron Corporation, Kuriyama has been instrumental in developing inspection technologies that address the complex requirements of modern manufacturing processes. Her work has streamlined quality assurance, making it easier for companies to maintain high standards in product quality and efficiency.
Collaborations
Jun Kuriyama has collaborated with notable colleagues, including Masato Ishiba and Kiyoshi Murakami. Their teamwork has fostered an environment of innovation and has led to the successful implementation of advanced inspection methodologies within the company. Together, they continue to push the boundaries of what is possible in quality control technologies.
Conclusion
Jun Kuriyama's contributions to inspection technology exemplify the spirit of innovation that drives the industry forward. With her expertise and a growing portfolio of patents, she stands as a testament to the impact that inventive minds can have on enhancing manufacturing processes. As she continues her work at Omron Corporation, the future holds boundless potential for further advancements in inspection methodologies.