This inventor holds 1 USPTO granted patent. Top assignee: Fuji Photo Optical Co., Ltd.. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1994
Title: Jumpei Tsujiuchi: Innovator in Surface Measurement Technology
Introduction
Jumpei Tsujiuchi is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of surface measurement technology. His innovative approach has led to the development of a unique method that enhances the accuracy of surface measurements.
Latest Patents
Tsujiuchi holds a patent for a "Method for divisional measurement of object surface." This method involves measuring each sub-area of an object's surface with partial overlapping on the peripheral edges of adjacent sub-areas. The surface state data of each sub-area is acquired and calculated to produce a reconstructed image. The images of the reconstructed sub-areas are made to partially overlap, and differences between the reconstructed images at selected points within the overlapped region are determined. A predetermined calculation is performed to determine coefficients for altering the relative alignment of the reconstructed images, which minimizes the differences. The reconstructed images are then contiguously joined together by applying the coefficients, ensuring that the boundaries between the reconstructed images are accurately formed.
Career Highlights
Tsujiuchi has worked with Fuji Photo Optical Co., Ltd., where he has been able to apply his innovative ideas in a practical setting. His work has contributed to advancements in optical technologies and measurement techniques.
Collaborations
One of his notable collaborators is Katsuyuki Okada, with whom he has worked on various projects related to surface measurement technology.
Conclusion
Jumpei Tsujiuchi's contributions to the field of surface measurement technology demonstrate his innovative spirit and dedication to advancing optical measurement techniques. His patent reflects a significant step forward in achieving more accurate surface measurements, which can have wide-ranging applications in various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
