The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 1994
Filed:
Mar. 17, 1992
Jumpei Tsujiuchi, Kanagawa, JP;
Katsuyuki Okada, Tokyo, JP;
Fuji Photo Optical Co., Ltd., Omiya, JP;
Abstract
Each sub-area of an object surface is measured with a partial overlapping on the peripheral edges of at least adjacent sub-areas. Surface state data of each sub-area is acquired and calculated to produce a reconstructed image. The images of the reconstructed sub-areas are made to partially overlap, and differences between the reconstructed images at selected points within the overlapped region are determined. A predetermined calculation is performed to determine coefficients, for altering the relative alignment of the reconstructed images, which minimize the differences. The reconstructed images are contiguously joined together by application of the coefficients. Thus, boundaries between the reconstructed images are joined contiguously into an accurate form.