KANAGAWA, Japan

Jumpei Kawano

This inventor holds 1 USPTO granted patent. Top assignee: Sony Semiconductor Solutions Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jumpei Kawano. Retrieved from https://idiyas.com/inventor/jumpei-kawano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jumpei Kawano: Inventor in Solid-State Imaging Technology

Introduction

Jumpei Kawano is an inventor associated with Kanagawa, Japan, and Sony Semiconductor Solutions Corporation. His patent work includes technology designed to help preserve image quality in solid-state imaging systems.

Latest Patents

Kawano is named on 1 patent: “Solid-State Imaging Device, Package, and Imaging System.” The invention describes a solid-state imaging device with a photoelectric conversion unit made from a material with lower band-gap energy than silicon, joined to a circuit substrate. The substrate includes a circuit that generates pixel signals based on charge from the photoelectric conversion unit, a thermometer circuit that detects substrate temperature, and a control-signal circuit that uses temperature information to generate a temperature-control signal. The disclosed approach is intended to curb image-quality degradation.

Career Highlights

Kawano’s listed patent reflects work in imaging-device design, including the integration of photoelectric conversion, pixel-signal generation, and temperature monitoring and control. He is associated with Sony Semiconductor Solutions Corporation.

Collaborations

Kawano’s listed coworkers include Toshiaki Nakano and Kiyoshige Tsuji.

Conclusion

Jumpei Kawano’s patent contribution focuses on temperature-aware solid-state imaging technology intended to support image quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…