This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Innovations by Julien Georges Heyman
Introduction
Julien Georges Heyman is a notable inventor based in Buc, France. He has made significant contributions to the field of X-ray technology, particularly through his innovative methods for improving flat-panel X-ray detectors. His work has implications for medical imaging and diagnostics, enhancing the accuracy and efficiency of X-ray systems.
Latest Patents
Heyman holds a patent for a "Method for the correction of lag charge in a flat-panel X-ray detector." This method allows for the determination of an initial read phase just before the integration phase of the detector. By measuring the charges present during this initial read phase, the method enables the production of a lag image from the latent charges. This lag image can then be subtracted from the raw image, allowing for direct correction without the need for a correction module, which is a significant advancement over prior art. He has 1 patent to his name.
Career Highlights
Julien Georges Heyman is associated with General Electric Company, where he has applied his expertise in developing advanced imaging technologies. His work has contributed to the enhancement of X-ray detection systems, making them more reliable and effective for medical applications.
Collaborations
Heyman has collaborated with notable colleagues such as Guillaume Bacher and Mathieu Seval. These partnerships have fostered innovation and have been instrumental in the development of new technologies in the field of X-ray imaging.
Conclusion
Julien Georges Heyman is a distinguished inventor whose work in the correction of lag charges in flat-panel X-ray detectors represents a significant advancement in medical imaging technology. His contributions continue to influence the field and improve diagnostic capabilities.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
