The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2010
Filed:
Jun. 03, 2008
Guillaume Bacher, Voiron, FR;
Mylene Roussel, Saint Germian, FR;
Benjamin Didier Rene Wimille, Versailles, FR;
Mathieu Seval, Villepreux, FR;
Julien Georges Heyman, Buc, FR;
Guillaume Bacher, Voiron, FR;
Mylene Roussel, Saint Germian, FR;
Benjamin Didier Rene Wimille, Versailles, FR;
Mathieu Seval, Villepreux, FR;
Julien Georges Heyman, Buc, FR;
General Electric Company, Schenectady, NY (US);
Abstract
A method for the correction of lag charges in a flat-panel X-ray detector makes it possible, for each integration phase of the detector, to determine an initial read phase situated just before said integration phase. The method of the invention enables the measurement, for each integration phase, of the charges present in the detector at the corresponding initial read phase, the production of a lag image from the latent charges measured in the initial read phase and the subtraction of the lag image from the raw image. The use of the measurement of charges enables the direct correction of the lag image in the acquisition without the use of a correction module as in the prior art.