Company Filing History:
Years Active: 2006
Title: The Innovative Contributions of Juinn Lee
Introduction
Juinn Lee is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of logic integrated circuits, showcasing his expertise through his innovative methodologies. His work has implications for improving the reliability and efficiency of electronic devices.
Latest Patents
Juinn Lee holds a patent titled "Methodology of locating faults of scan chains in logic integrated circuits." This patent describes a process for retrieving initial value vectors associated with flip-flops from corresponding scan chain sets. By comparing these vectors, the methodology identifies elements with fixed values, which are then selected as a golden pattern for testing. This approach allows for the detection of faulty flip-flops in logic integrated circuits, enhancing the testing process.
Career Highlights
Juinn Lee is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His role involves developing innovative solutions that address complex challenges in integrated circuit design and testing. His contributions have been instrumental in advancing the company's technological capabilities.
Collaborations
Juinn Lee has collaborated with notable colleagues, including Chin-pin Jen and Ming-Chang Yang. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further driving innovation in their field.
Conclusion
Juinn Lee's work exemplifies the spirit of innovation in the semiconductor industry. His patent and contributions to United Microelectronics Corporation highlight his commitment to enhancing the reliability of logic integrated circuits. His efforts continue to shape the future of technology.