The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 31, 2003
Juinn Lee, Hsinchu, TW;
Chin-pin Jen, Taipei, TW;
Ming-chang Yang, Hsinchu, TW;
Hung-chieh Chen, Hsinchu, TW;
Juinn Lee, Hsinchu, TW;
Chin-pin Jen, Taipei, TW;
Ming-chang Yang, Hsinchu, TW;
Hung-chieh Chen, Hsinchu, TW;
United Microelectronics Corp., Hsinchu, TW;
Abstract
For a plurality of logic integrated circuits, initial value vectors associated with flip-flops are retrieved from each of corresponding scan chain sets. The initial value vectors of the same corresponding scan chain set are compared with each other so as to identify elements with fixed values in the initial value vectors. When the total number of the elements with fixed values reaches a predetermined percentage, the elements having fixed values are selected as a golden pattern of the corresponding scan chain set. During the testing, an initial value vector of a scan chain of a logic integrated circuit to be tested is compared with the golden pattern associated with the scan chain, so as to determine whether a faulty flip-flop exists in the scan chain of the logic integrated circuit to be tested.