Hung-chieh Chen

Title: Innovations of Hung-chieh Chen

Introduction

Hung-chieh Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of logic integrated circuits. His innovative methodologies have paved the way for advancements in fault detection within these circuits.

Latest Patents

Hung-chieh Chen holds a patent titled "Methodology of locating faults of scan chains in logic integrated circuits." This patent involves a process where initial value vectors associated with flip-flops are retrieved from corresponding scan chain sets. The methodology compares these initial value vectors to identify elements with fixed values. When a predetermined percentage of these elements is reached, they are selected as a golden pattern for the scan chain set. This process is crucial during testing, as it helps determine the presence of faulty flip-flops in the logic integrated circuit.

Career Highlights

Hung-chieh Chen is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His work focuses on enhancing the reliability and efficiency of integrated circuits through innovative fault detection techniques. His contributions have been instrumental in improving the performance of various electronic devices.

Collaborations

Hung-chieh Chen has collaborated with notable colleagues, including Juinn Lee and Chin-pin Jen. Their teamwork has fostered an environment of innovation and has led to the development of advanced methodologies in the field.

Conclusion

Hung-chieh Chen's work exemplifies the spirit of innovation in the semiconductor industry. His patent on fault detection methodologies showcases his commitment to enhancing the reliability of logic integrated circuits. His contributions continue to influence the field positively.