Company Filing History:
Years Active: 2007
Title: Juergen Rolf Mueller: Innovator in Scanning Microscopic Methods
Introduction
Juergen Rolf Mueller is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of optical detection and microscopy. His innovative approach has led to advancements in the way entities are detected on substrates.
Latest Patents
Juergen Rolf Mueller holds a patent for a "Scanning microscopic method having high axial resolution." This invention relates to a method for optically detecting at least one entity arranged on a substrate. The method involves scanning the entity with a measuring volume using at least one radiation source and a confocal optic. During the scanning process, an auxiliary focus is generated by means of at least one second radiation source and a second optic. The radiation generated by the first radiation source is collimated by a first optic, while the radiation from the second source is collimated by a second optic. A retroreflection from the auxiliary focus is detected by at least one detector, which is used to measure the position of an interface, thereby indirectly positioning the measuring volume. The position of the auxiliary focus relative to the measuring volume is adjustable in a defined manner.
Career Highlights
Juergen Rolf Mueller is associated with Evotec Biosystems AG, where he continues to work on innovative solutions in the field of biosystems. His expertise in microscopy and optical detection has positioned him as a key figure in his organization.
Collaborations
He collaborates with notable colleagues such as Karsten Henco and Rodney Turner, contributing to a dynamic work environment that fosters innovation.
Conclusion
Juergen Rolf Mueller's contributions to the field of scanning microscopic methods highlight his role as an influential inventor. His work continues to impact the scientific community and advance optical detection technologies.