This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Jubok Lee and Semiconductor Inspection Technology.
Introduction
Jubok Lee is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Co., Ltd. His patent work concerns inspection technology for semiconductor devices.
Latest Patents
Lee is credited with 1 patent: “Inspection Apparatus for Semiconductor Device.” The invention describes an apparatus with a chamber and a substrate stage that holds a test wafer containing multiple wiring layers. A milling device partially removes material from the wafer, while a measuring device directs light onto it and uses a polarization camera to scan the reflected light. The apparatus measures the reflected light’s polarization characteristics and assesses wafer uniformity.
Career Highlights
Lee’s listed patent highlights work on semiconductor inspection, combining wafer preparation with optical measurement. The design is intended to examine test wafers and evaluate their uniformity.
Collaborations
Lee’s listed coworkers include Soonyang Kwon and Kwangrak Kim. The patent information provided does not specify their roles or contributions to this invention.
Conclusion
Jubok Lee’s patent reflects an approach to semiconductor inspection that integrates partial wafer milling with polarization-based optical measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile