Xi'an, China

Juan Du

This inventor holds 1 USPTO granted patent. Top assignee: Xidian University. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juan Du. Retrieved from https://idiyas.com/inventor/juan-du-8qtjxi29

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 16.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations by Juan Du in Infrared Image Processing

Introduction

Juan Du is an accomplished inventor based in Xi'an, China. He has made significant contributions to the field of infrared image processing. His innovative approach focuses on enhancing the quality of infrared images through advanced correction methods.

Latest Patents

Juan Du holds a patent for an "Interframe registration and adaptive step size-based non-uniformity correction method for infrared image." This method involves calculating a normalized cross-power spectrum of original infrared images to address non-uniformity. It further calculates relative displacements and variances to adaptively correct pixel values, ultimately improving the accuracy of infrared imaging.

Career Highlights

Juan Du is affiliated with Xidian University, where he continues to advance research in image processing technologies. His work has garnered attention for its practical applications in various fields, including surveillance and medical imaging.

Collaborations

Juan collaborates with notable colleagues, including Huixin Zhou and Dong Zhao, who contribute to his research endeavors. Their combined expertise enhances the development of innovative solutions in infrared imaging.

Conclusion

Juan Du's contributions to infrared image processing exemplify the impact of innovative thinking in technology. His patented methods represent a significant advancement in the field, showcasing the importance of research and collaboration in driving progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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