The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Mar. 28, 2018
Xidian University, Xi'an, CN;
Huixin Zhou, Xi'an, CN;
Dong Zhao, Xi'an, CN;
Runda Qian, Xi'an, CN;
Lixin Guo, Xi'an, CN;
Xiuping Jia, Xi'an, CN;
Jun Zhou, Xi'an, CN;
Maosen Huang, Xi'an, CN;
Hanlin Qin, Xi'an, CN;
Bo Yao, Xi'an, CN;
Yue Yu, Xi'an, CN;
Huan Li, Xi'an, CN;
Jiangluqi Song, Xi'an, CN;
Bingjian Wang, Xi'an, CN;
Kuanhong Cheng, Xi'an, CN;
Juan Du, Xi'an, CN;
Shangzhen Song, Xi'an, CN;
XIDIAN UNIVERSITY, Xi'an, CN;
Abstract
An interframe registration and adaptive step size-based non-uniformity correction method for an infrared image, comprising: first calculating a normalized cross-power spectrum of n-th and (n−1)-th original infrared images with the non-uniformity, and then calculating a horizontal relative displacement and a vertical relative displacement of the n-th and (n−1)-th original infrared images with the non-uniformity; calculating a space variance and a time variance of each pixel of the n-th original infrared image with the non-uniformity, using the obtained space variance and time variance to calculate an adaptive iterative step size of each pixel of the n-th original infrared image with the non-uniformity, and using the iterative step size to update a gain correction coefficient and a bias correction coefficient; finally, performing non-uniformity correction on the pixel in an overlapping area of the n-th and (n−1)-th original infrared images with the non-uniformity.