Carrollton, TX, United States of America

Joseph Pautler

This inventor holds 1 USPTO granted patent. Top assignee: Authentix, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joseph Pautler. Retrieved from https://idiyas.com/inventor/joseph-pautler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Joseph Pautler: Innovator in Document Image Processing

Introduction

Joseph Pautler is a notable inventor based in Carrollton, TX (US). He has made significant contributions to the field of document image processing. His innovative approach to determining the skew angle of document images has garnered attention in the industry.

Latest Patents

Joseph Pautler holds a patent for a method titled "Skew angle determination." This patent focuses on estimating the skew angle of a document image by examining patterns found within a Fast Fourier Transform of a subset of the document image. This technique allows for fast and accurate skew angle estimation, even for arbitrary document fragments.

Career Highlights

Joseph Pautler is currently employed at Authentix, Inc. His work at the company has been instrumental in advancing technologies related to document processing. He has demonstrated a strong commitment to innovation and excellence in his field.

Collaborations

Throughout his career, Joseph has collaborated with notable colleagues, including Alan Hunt and Ralph E. Payne. These partnerships have contributed to the development of cutting-edge solutions in document image analysis.

Conclusion

Joseph Pautler's contributions to the field of document image processing highlight his innovative spirit and dedication to advancing technology. His patent on skew angle determination is a testament to his expertise and impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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