The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Apr. 06, 2012
Applicants:
Joseph Pautler, Carrollton, TX (US);
Alan Hunt, Dallas, TX (US);
Ralph Payne, Dallas, TX (US);
Inventors:
Assignee:
Authentix, Inc., Addison, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/387 (2006.01); G06K 9/32 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3878 (2013.01); G06K 9/3275 (2013.01); G06K 9/522 (2013.01);
Abstract
The skew angle of a document image is determined or estimated. The skew angle is determined or estimated by examining patterns found within a Fast Fourier Transform of a subset of the document image. This technique exploits the internal structure of the document designs to allow fast and accurate skew angle estimation, including for arbitrary document fragments.