Somerset, NJ, United States of America

Joseph Lamb

This inventor holds 1 USPTO granted patent. Top assignee: Veeco Instruments Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joseph Lamb. Retrieved from https://idiyas.com/inventor/joseph-lamb-9njtijdf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Joseph Lamb - Innovator in Wafer Processing Technology

Introduction

Joseph Lamb is a notable inventor based in Somerset, NJ (US). He has made significant contributions to the field of wafer processing technology. His innovative approach has led to the development of a unique filter element designed specifically for wafer processing systems.

Latest Patents

Joseph Lamb holds a patent for a "Filter element for wafer processing assembly." This invention focuses on filter elements for gaseous fluid filtration, such as air, within wafer processing systems. The filter elements feature a pleat ratio of no greater than 7, optimizing the spacing between pleats. This design balances the filtration media area against the effective area, minimizing losses due to contaminant bridging.

Career Highlights

Joseph is currently employed at Veeco Instruments Inc., where he continues to advance his work in wafer processing technology. His expertise in this area has positioned him as a valuable asset to his company and the industry.

Collaborations

Joseph collaborates with talented coworkers, including Ankit Modi and Maria D Ferreira. Their combined efforts contribute to the innovative environment at Veeco Instruments Inc.

Conclusion

Joseph Lamb's contributions to wafer processing technology through his patented filter element demonstrate his commitment to innovation. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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