Santa Fe, NM, United States of America

Joseph D Sherman

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Phoenix LLC. Active years: 2017-2021.


% Patents Active = 100.0

 

Average Co-Inventor Count = 12.0

ph-index = 2

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2017-2021

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3 patents (USPTO):Explore Patents

Title: Innovations of Joseph D Sherman

Introduction

Joseph D Sherman is a notable inventor based in Santa Fe, NM (US). He has made significant contributions to the field of negative ion sources, holding a total of three patents. His work focuses on enhancing the reliability and longevity of these technologies.

Latest Patents

One of his latest patents is a high reliability, long lifetime negative ion source. This invention includes a plasma chamber, a microwave source, a negative ion converter, a magnetic filter, and a beam formation mechanism. The plasma chamber contains gas to be ionized, while the microwave source transmits microwaves to the plasma chamber to ionize the gas into atomic species, including hyperthermal neutral atoms. The negative ion converter then converts these hyperthermal neutral atoms into negative ions. Additionally, the magnetic filter reduces the temperature of the electron density provided between the plasma chamber and the negative ion converter. Finally, the beam formation mechanism extracts the negative ions.

Career Highlights

Joseph D Sherman is currently associated with Phoenix LLC, where he continues to innovate and develop new technologies. His work has been instrumental in advancing the field of negative ion sources.

Collaborations

Some of his notable coworkers include Evan R Sengbusch and Ross F Radel, who have collaborated with him on various projects.

Conclusion

Joseph D Sherman is a prominent inventor whose work in negative ion sources has led to significant advancements in the field. His innovative patents and collaborations highlight his commitment to technological progress.

Profile summary based on public USPTO records.
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