Boulder Creek, CA, United States of America

Joseph Alig

This inventor holds 1 USPTO granted patent. Top assignee: Guide Technology, Inc.. Active years: 2006.


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Joseph Alig - Innovator in Signal Path Calibration Technology

Introduction

Joseph Alig is a notable inventor based in Boulder Creek, California. He has made significant contributions to the field of signal path calibration technology. His innovative approach has led to the development of a unique patent that addresses critical challenges in testing systems.

Latest Patents

Joseph Alig holds a patent for a "System and method for calibrating signal paths connecting a device under test to a test system." This technology involves an apparatus and method for calibrating multiple distinct signal paths that connect a device under test (DUT) to a time measurement device. The calibration circuit measures the signal skew associated with each signal path, allowing for precise adjustments during testing. The stored skew values are utilized to enhance test signal accuracy and perform diagnostics on signal paths.

Career Highlights

Joseph Alig is associated with Guide Technology, Inc., where he applies his expertise in signal calibration. His work has been instrumental in advancing testing methodologies and improving the reliability of electronic devices. His innovative solutions have garnered attention in the industry.

Collaborations

Joseph collaborates with Stephen John Horne, contributing to the development of cutting-edge technologies in their field. Their combined efforts aim to enhance the efficiency and accuracy of testing systems.

Conclusion

Joseph Alig's contributions to signal path calibration technology exemplify the impact of innovation in the electronics testing industry. His patent reflects a commitment to improving testing processes and ensuring device reliability.

Profile summary based on public USPTO records.
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