Guide Technology, Inc.

Joseph Alig

Stephen John Horne

The present technology involves an apparatus and method for calibrating a plurality of distinct signal paths connecting a device under test (DUT) to a time measurement device. The disclosed calibration circuit, which may be connected to the test setup throughout the testing process, measures the signal skew associated with each distinct signal path connecting a DUT, such as an integrated circuit, to a time measurement device, such as a time interval analyzer. The measured skew values, which may be collected throughout the testing process, are stored in memory. Such memory may be within the time measure device, an external storage device or a computing device that may be in communication with the time measurement device. The time measurement device uses the stored skew values to adjust the test signals to compensate for signal path related signal skew. In addition, the stored skew values are used to perform signal path diagnostics. This is accomplished by comparing newly measured skew values to stored skew values and generating a signal path failure signal when the newly measured skew values fall outside a user programmable range of acceptable skew values.

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Boulder Creek, CA, United States of America

Joseph Alig