This inventor holds 1 USPTO granted patent. Top assignees: Microsemi Corporation, United States of America, as Represented by the Secretary of Agriculture. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2014
Title: Joseph A Viera, Jr: Innovator in Measurement Systems
Introduction
Joseph A Viera, Jr is an accomplished inventor based in Manchester, NH (US). He has made significant contributions to the field of measurement systems, particularly through his innovative patent that focuses on accurate permittivity measurements.
Latest Patents
Joseph A Viera, Jr holds a patent for an "Interrogation measurement system and method providing accurate permittivity measurements via ultra-wideband removal of spurious reflectors." This invention involves a method and apparatus for determining at least one property of a target material. The process includes providing a time-varying signal with frequency content over a range of frequencies, transducing the signal to interact with the target material, and receiving the signal after interaction. The method further involves mixing the received signal with a portion of the provided signal, determining the propagation delay associated with the target material, and ultimately determining at least one property of the target material based on the propagation delay.
Career Highlights
Throughout his career, Joseph has worked with notable organizations, including the United States of America, as represented by the Secretary of Agriculture, and Microsemi Corporation. His work has contributed to advancements in measurement technologies and methodologies.
Collaborations
Joseph has collaborated with professionals such as Mathew G Pelletier and Gregory A Holt, enhancing the development and application of his innovative ideas.
Conclusion
Joseph A Viera, Jr is a notable inventor whose work in measurement systems has paved the way for advancements in accurate material property determination. His contributions continue to influence the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile