The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Aug. 22, 2011
Mathew G. Pelletier, Idalou, TX (US);
Joseph A. Viera, Jr., Manchester, NH (US);
Gregory A. Holt, Brownfield, TX (US);
John D. Wanjura, Lubbock, TX (US);
Mathew G. Pelletier, Idalou, TX (US);
Joseph A. Viera, Jr., Manchester, NH (US);
Gregory A. Holt, Brownfield, TX (US);
John D. Wanjura, Lubbock, TX (US);
The United States of America as represented by the Secretary of Agriculture, Washington, DC (US);
Microsemi Corporation, Alexandria, VA (US);
Abstract
A method and apparatus for determining at least one property of a target material is disclosed. The method is constituted of: providing a time varying signal at comprising frequency content over a range of frequencies; transducing the provided signal so as to interact with the target material; receiving the provided time varying signal after interaction with the target material; mixing the received time varying signal with a portion of the provided time varying signal; determining the propagation delay associated with the target material of the received provided time varying signal at each of a plurality of frequencies within the range of frequencies; and determining at least one property of the target material responsive to the determined propagation delay at each of the plurality of frequencies.