This inventor holds 2 USPTO granted patents. Top assignees: Forschungszentrum Juelich Gmbh, Forschungszentrum Julich Gmbh. Active years: 1992-1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 1992-1994
Title: Josef Frohn: Innovator in Micromanipulation and Scanning Tunnel Microscopy
Introduction
Josef Frohn is a notable inventor based in Herzogenrath, Germany. He has made significant contributions to the fields of micromanipulation and scanning tunnel microscopy. With a total of 2 patents, his work has advanced the capabilities of precision movement and electron detection.
Latest Patents
Frohn's latest patents include a micromanipulator designed for the movement of objects relative to treatment or analysis positions. This innovative device features multiple kinematic elements that support the object or an object holder. The kinematic elements are piezo-electrically displaceable, allowing for both micromovements and macromovements. His second patent involves a scanning tunnel microscope capable of detecting electrons emanating from specimens. This microscope includes an emission tip, specimen holder, and a sophisticated xyz movement mechanism. It is equipped with devices for applying voltage and detecting electrons, enhancing the analysis of secondary electrons and energy analysis.
Career Highlights
Throughout his career, Frohn has worked with prominent research institutions, including Forschungszentrum Jülich GmbH. His expertise in micromanipulation and microscopy has positioned him as a key figure in these fields.
Collaborations
Frohn has collaborated with notable colleagues such as Karl-Heinz Besocke and Martin Teske. Their combined efforts have contributed to advancements in research and technology.
Conclusion
Josef Frohn's innovative work in micromanipulation and scanning tunnel microscopy has made a lasting impact on scientific research. His patents reflect a commitment to enhancing precision and analysis in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile