Joost Van Groen

Title: Joost Van Groen: Innovator in Wafer Mapping Technology

Introduction

Joost Van Groen is a notable inventor based in Utrecht, Netherlands. He has made significant contributions to the field of wafer mapping technology, holding 2 patents that enhance the efficiency of semiconductor manufacturing processes.

Latest Patents

His latest patents include a "Method for sensing wafers located inside a closed wafer cassette." This innovative method allows for the mapping of wafers without the need to open the cassette. The cassette is designed to be at least partially transparent to a specific type of radiation. A source of this radiation is directed into the cassette through a transparent or translucent part, while an imaging sensor detects the radiation reflected off the wafers inside. Additionally, a second source of radiation and a second camera provide supplementary images from a different angle. By processing these images, the spatial orientation of the wafers and the loading status of the cassette can be accurately determined. Another patent, titled "Method and apparatus for mapping of wafers located inside a closed wafer cassette," shares similar principles and applications, further showcasing his expertise in this area.

Career Highlights

Joost Van Groen is currently employed at ASML Holding N.V., a leading company in the semiconductor industry. His work focuses on developing advanced technologies that improve the efficiency and accuracy of wafer handling and processing.

Collaborations

Throughout his career, Joost has collaborated with esteemed colleagues such as Adriaan Garssen and Christianus Gerardus Maria De Ridder. Their combined expertise has contributed to the advancement of wafer mapping technologies.

Conclusion

Joost Van Groen's innovative work in wafer mapping technology has made a significant impact on the semiconductor industry. His patents reflect a commitment to improving manufacturing processes and enhancing the efficiency of wafer handling.