Joongsuk Oh

Title: Joongsuk Oh - Innovator in Semiconductor Measurement Data Transformation

Introduction

Joongsuk Oh is an inventor based in Suwon-si, South Korea. He is known for his contributions to the field of semiconductor technology, particularly in the area of measurement data transformation. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

1. **DEVICE, METHOD, AND SYSTEM FOR TRANSFORMING MEASUREMENT DATA** - This application relates to devices, methods, and systems for transforming measurement data. An example device includes a communicator configured to receive first measurement data, which includes step height values on a semiconductor chip that has undergone a chemical mechanical polishing (CMP) process. The device also receives layout data comprising a layout included in the semiconductor chip. A processor is configured to transform the first measurement data into second measurement data based on the layout data, with the second measurement data including step height values of the semiconductor chip with a metal deposited thereon.

2. **OFFSET DATA CORRECTION METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD INCLUDING THE SAME** - This application describes an offset data correction method that involves measuring a measurement target that has undergone a CMP process. It includes generating an offset correction model based on the measurement of the target and using this model to correct measured data. The offset correction model is trained using the measured data and layout data of the measurement target as inputs.

Conclusion

Joongsuk Oh is an innovative inventor whose work focuses on enhancing semiconductor measurement processes. His latest patent applications demonstrate his commitment to advancing technology in this field.