Joon-su Ji

Title: Innovations of Joon-su Ji in Probe Card Inspection Technology

Introduction

Joon-su Ji is a notable inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of probe card inspection technology. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of probe card inspections.

Latest Patents

Joon-su Ji's latest patents include innovative technologies such as the probe card inspection wafer and the probe card inspection system. The probe card inspection wafer features a base wafer with first and second probe card inspection chips. These chips are strategically placed apart from each other and are divided into various inspection regions. The design allows for the inspection of vertical levels of alternating-current probes and VSS probes of the probe card. Additionally, his probe card inspection apparatus includes a substrate and a first insulating layer, along with a detection unit that identifies physical defects in the probes of the card.

Career Highlights

Joon-su Ji is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies in the field of electronics. His work has been instrumental in advancing the capabilities of probe card inspections, which are critical for ensuring the quality and reliability of semiconductor devices.

Collaborations

Throughout his career, Joon-su Ji has collaborated with talented individuals such as Shin-Ho Kang and Jung-woo Kim. These collaborations have fostered a creative environment that has led to the development of innovative solutions in probe card inspection technology.

Conclusion

Joon-su Ji's contributions to probe card inspection technology exemplify the importance of innovation in the electronics industry. His patents and ongoing work at Samsung Electronics Co., Ltd. highlight his commitment to advancing technology and improving inspection processes.