Jongho Lee

Title: Innovations by Jongho Lee in Defect Detection Technology

Introduction

Jongho Lee is an accomplished inventor based in San Jose, CA (US). He has made significant contributions to the field of defect detection technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of defect location reporting.

Latest Patents

Jongho Lee holds a patent for a "Panel design to improve accurate defect location report." This invention describes an array checker (AC) that includes software configured to implement a method for detecting defect locations. The method compensates for shifts in defects by generating reference lines in a panel, which are known prior to capturing an image of the panel. The array checker captures the image using voltage imaging, which includes both the defect and the reference lines. The method then calculates an offset of the reference line from the known location and applies this offset to the defect location to compensate for any shifts.

Career Highlights

Jongho Lee is currently employed at Orbotech Limited, where he continues to innovate in the field of defect detection. His work has been instrumental in advancing technologies that improve manufacturing processes and quality control.

Collaborations

Jongho has collaborated with notable colleagues, including Chih-Chang Lai and Nai-Wei Chen. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Jongho Lee's innovative work in defect detection technology exemplifies the impact of dedicated inventors in advancing industrial processes. His patent reflects a significant step forward in improving accuracy in defect location reporting.