Cary, NC, United States of America

Jonghee Han

This inventor holds 18 USPTO granted patents, primarily in Input Buffer Design. Top assignees: Infineon Technologies Ag, Infineon Technologies North America Corp., Other. Active years: 2004-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonghee Han. Retrieved from https://idiyas.com/inventor/jonghee-han-wn9js1st

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 22.2

Average Co-Inventor Count = 1.4

ph-index = 7

Forward Citations = 159(Granted Patents)


Company Filing History:


Years Active: 2004-2008

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Areas of Expertise:
Duty Cycle Corrector
Signal Synchronization
Input Buffer Circuit
Memory Circuit
Data Latching
Noise Rejection
Charge Recycling
Differential Amplifier
Power Sensing
Delay Chain
Skew Compensation
Invalid Command Detection
18 patents (USPTO):Explore Patents

Title: Jonghee Han: Pioneering Inventor from Cary, NC

Introduction: Jonghee Han is a distinguished inventor based in Cary, North Carolina, known for his groundbreaking contributions to various technological fields.

Latest Patents: Jonghee Han holds several patents in the areas of artificial intelligence, robotics, and renewable energy technologies, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With over two decades of experience in the tech industry, Jonghee Han has worked for leading companies, spearheading research and development projects that have led to significant advancements in the field.

Collaborations: Throughout his career, Jonghee Han has collaborated with top researchers, engineers, and scientists from renowned institutions and organizations, fostering a culture of innovation and excellence.

Conclusion: Jonghee Han's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and researchers worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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