Goleta, CA, United States of America

Jonathan W Lai


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Innovations of Jonathan W Lai

Introduction

Jonathan W Lai is an accomplished inventor based in Goleta, California. He has made significant contributions to the field of microengineering, particularly in the development of methods to enhance the performance of microcantilevers. His innovative approach addresses critical challenges in the design and functionality of microprobes.

Latest Patents

Jonathan W Lai holds a patent for an "Apparatus and method to compensate for stress in a microcantilever." This invention presents a method to compensate for stress-induced deflection in a compound microprobe. The apparatus includes a substrate, a microcantilever extending outwardly from the substrate, and a film formed on the microcantilever. The method involves determining the amount of stress-induced deflection and mounting the microprobe to compensate for this deflection. The compensation piece is selected based on the deflection amount, ensuring that light reflected from the microcantilever during operation accurately contacts a detector.

Career Highlights

Jonathan is currently associated with Veeco Instruments Inc., where he continues to innovate and develop advanced technologies. His work focuses on enhancing the precision and reliability of microcantilever systems, which are essential in various applications, including sensing and imaging.

Collaborations

Some of Jonathan's notable coworkers include Hector Cavazos and Stephen C Minne. Their collaborative efforts contribute to the advancement of technologies in the field of microengineering.

Conclusion

Jonathan W Lai's contributions to the field of microengineering through his innovative patent demonstrate his commitment to advancing technology. His work not only addresses existing challenges but also paves the way for future developments in microprobe technology.

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