Jonathan Madsen

Title: Innovations of Jonathan Madsen

Introduction

Jonathan Madsen is an accomplished inventor based in Los Altos, California. He has made significant contributions to the field of metrology, particularly with his innovative patent that enhances measurement techniques in various applications.

Latest Patents

Madsen holds a patent for a "Massive overlay metrology sampling with multiple measurement columns." This invention involves a multi-column metrology tool that includes two or more measurement columns distributed along a column direction. These measurement columns can simultaneously probe multiple measurement regions on a sample that includes metrology targets. The design features an illumination sub-system to direct light to the sample, a collection sub-system with a lens to gather measurement signals, and a column-positioning sub-system to adjust the lens's position. The tool also incorporates a sample-positioning sub-system to scan the sample along a different path, allowing for precise positioning of metrology targets within the measurement regions.

Career Highlights

Throughout his career, Jonathan Madsen has worked with notable companies such as Kla Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed to his expertise in metrology and measurement technologies.

Collaborations

Madsen has collaborated with several professionals in his field, including Andrei V. Shchegrov and Amnon Manassen. These collaborations have further enriched his work and innovations in metrology.

Conclusion

Jonathan Madsen's contributions to metrology through his innovative patent demonstrate his expertise and commitment to advancing measurement technologies. His work continues to influence the field and inspire future innovations.