Jonathan H Orloff

Title: Innovations of Jonathan H Orloff

Introduction

Jonathan H Orloff is an accomplished inventor based in Rockaway Beach, Oregon. He holds a total of four patents, showcasing his expertise in the field of charged particle detection and imaging systems. His innovative contributions have significantly advanced the technology used in various applications.

Latest Patents

One of his latest patents is a charged particle detector, which discloses a charged particle beam system designed for imaging and processing targets. This system comprises a charged particle column, a secondary particle detector, and a secondary particle detection grid assembly positioned between the target and the detector. The grid assembly features multiple grids, each with a separate bias voltage, allowing for the adjustment of the electric field to optimize the spatial distribution of secondary particles reaching the detector. This innovation aims to enhance the detector's lifetime by ensuring a more uniform dose distribution across the detector area.

Another notable patent is focused on a charged particle column that operates effectively at different beam energies. This column utilizes a four-element objective lens to improve beam focusing performance at both high and low beam energies. By adjusting the voltages applied to the four electrodes of the objective lens, different focusing conditions can be rapidly configured, facilitating quick transitions between optimized imaging and processing of a target.

Career Highlights

Throughout his career, Jonathan H Orloff has worked with notable organizations, including FEI Company and the Government of the United States of America, as