Company Filing History:
Years Active: 2020
Title: Innovations of Jonas Hiller in Scanning Probe Microscopy
Introduction
Jonas Hiller is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of microscopy, particularly through his innovative patent related to scanning probe microscopy. His work has implications for various scientific and industrial applications.
Latest Patents
Hiller holds a patent for a measuring device for a scanning probe microscope. This invention includes a measuring probe, a first probe holding device, and a detection device with a measurement light source. The device is designed to provide light beams directed toward the measuring probe, with a sensor that receives measurement light beams reflected from the probe. The invention features two measuring arrangements that allow for adjustable spacing between the probe holding device and the detection device, enhancing the functionality of the scanning probe microscope.
Career Highlights
Jonas Hiller is currently employed at Bruker Nano GmbH, where he continues to develop innovative solutions in microscopy. His expertise in this field has led to advancements that improve measurement accuracy and efficiency in scientific research.
Collaborations
Hiller has collaborated with notable colleagues, including Detlef Knebel and Torsten Jähnke. Their combined efforts contribute to the ongoing development of advanced technologies in microscopy.
Conclusion
Jonas Hiller's contributions to scanning probe microscopy exemplify the importance of innovation in scientific research. His patent and work at Bruker Nano GmbH highlight his role as a key figure in advancing measurement technologies.