Jon W Weilemann, II is a notable inventor based in Austin, TX, specializing in advancements in non-volatile memory (NVM) technology. With a total of 5 patents to his name, he has made significant contributions to the field, particularly in the area of imminent read failure detection.

Latest Patents

Weilemann's latest patents include innovative methods and systems for detecting imminent read failures using high and low read voltage levels. These methods involve checking data stored within an array of NVM cells with voltage levels that are both below and above the normal read voltage level. If errors are detected at the same address during these checks, it indicates an imminent read failure. Additionally, his work includes detecting imminent read failures based on unacceptable wear for NVM cells. This involves recording failure times during diagnostic modes and comparing them against a threshold wear time value to determine the likelihood of imminent read failures.

Career Highlights

Jon W Weilemann, II is currently employed at Freescale Semiconductor, Inc., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in NVM technology has positioned him as a key player in the field, contributing to advancements that enhance data reliability and performance.

Collaborations

Throughout his career, Weilemann has collaborated with talented individuals such as Richard Eguchi and Chen He. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Jon W Weilemann, II stands out as a significant inventor in the realm of non-volatile memory technology. His contributions through innovative patents and collaborations continue to shape the future of data storage solutions.

Profile summary based on public USPTO records.

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