The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Sep. 21, 2010
Richard K. Eguchi, Austin, TX (US);
Daniel Hadad, Austin, TX (US);
Chen He, Austin, TX (US);
Katrina M. Prosperi, Austin, TX (US);
Jon W. Weilemann, Ii, Austin, TX (US);
Richard K. Eguchi, Austin, TX (US);
Daniel Hadad, Austin, TX (US);
Chen He, Austin, TX (US);
Katrina M. Prosperi, Austin, TX (US);
Jon W. Weilemann, II, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method and system are provided for determining an imminent failure of a non-volatile memory array. The method includes: performing a first array integrity read of the memory array until an error is detected; determining that the error is not error correction code (ECC) correctable, wherein a first word line voltage associated with the error is characterized as being a first threshold voltage; performing a second array integrity read of the memory array until all bits of the memory array indicate a predetermined state, wherein a second word line voltage associated with all of the bits indicating the predetermined state is a second threshold voltage; and comparing a difference between the first and second threshold voltages to a predetermined value.