Jon Madsen

Title: Innovations of Jon Madsen in Semiconductor Manufacturing

Introduction

Jon Madsen is an accomplished inventor based in Los Altos, California. He has made significant contributions to the field of semiconductor manufacturing, holding two patents that showcase his innovative approach to measuring overlay errors in manufacturing processes.

Latest Patents

Madsen's latest patents focus on the measurement of overlay error using a device inspection system. This method and system involve capturing an image of a feature in an article at a predetermined manufacturing stage. The process derives a quantity of an image parameter from the image and converts this quantity into an overlay measurement. The conversion is referenced against an image parameter quantity derived from a reference image of a feature at the same manufacturing stage with known overlay (OVL). Additionally, the patents disclose a method for determining a device inspection recipe for use by an inspection tool. This includes identifying device patterns as candidate device care areas sensitive to OVL, deriving an OVL response for each identified pattern, correlating the OVL response with measured OVL, and selecting device patterns as care areas based on this correlation.

Career Highlights

Jon Madsen is currently employed at KLA-Tencor Corporation, a leading company in the semiconductor industry. His work has been pivotal in enhancing the accuracy and efficiency of semiconductor manufacturing processes.

Collaborations

Madsen has collaborated with notable colleagues such as Choon Hoong Hoo and Fangren Ji, contributing to advancements in their field through teamwork and shared expertise.

Conclusion

Jon Madsen's innovative patents and contributions to semiconductor manufacturing highlight his role as a key inventor in the industry. His work continues to influence the development of more precise manufacturing techniques.