Shanghai, China

Jon Davis

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2007.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:

goldMedal1 out of 834,411 
Other
 patents

Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Jon Davis - Innovator in Semiconductor Device Fabrication

Introduction

Jon Davis is a notable inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor device fabrication. His innovative approach has led to the development of a unique edge protection process that enhances the efficiency and quality of semiconductor manufacturing.

Latest Patents

Jon Davis holds a patent for an edge protection process for semiconductor device fabrication. This process involves forming a protective layer on the circumferential edge region of a semiconductor substrate. The substrate is then placed in a plasma atmosphere where trench structures, such as deep trenches and shallow trench isolation structures, are etched. The protective layer effectively prevents the etching of the circumferential edge region, thereby minimizing the formation of black silicon during the etching process. He has 1 patent to his name.

Career Highlights

Throughout his career, Jon has demonstrated a commitment to advancing semiconductor technology. His work has been instrumental in improving the reliability and performance of semiconductor devices. He continues to explore new methodologies that push the boundaries of what is possible in this field.

Collaborations

Jon has collaborated with several talented individuals in the industry, including Franz Hagl and Michael Rennie. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Jon Davis is a pioneering inventor whose work in semiconductor device fabrication has made a lasting impact on the industry. His edge protection process exemplifies the importance of innovation in technology.

Profile summary based on public USPTO records.
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