This inventor holds 1 USPTO granted patent. Top assignee: National Technology & Engineering Solutions of Sandia, LLC. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations of Johnathan Mulcahy-Stanislawczyk
Introduction
Johnathan Mulcahy-Stanislawczyk is an accomplished inventor based in Albuquerque, NM. He has made significant contributions to the field of imaging technology, particularly through his innovative patent.
Latest Patents
Johnathan holds a patent for a "Speckle-based imaging diffuser and method for controllably fabricating same." This invention involves a mask designed for use in speckle-based x-ray or neutron phase contrast imaging systems. The mask can either absorb or alter the phase of the incident x-ray or neutron beam. It features consistent statistics across its surface, is locally unique to avoid ambiguous correlations, and has a speckle size that aligns with the imaging system's resolution. The speckle pattern is visible through the sample being imaged and is tailored to match the energy level of the imaging system and the sample density. The attributes of the mask are controlled by the methods and materials used in its fabrication, with various embodiments utilizing a pseudo-random binary array to generate the required speckle pattern.
Career Highlights
Johnathan is currently employed at National Technology & Engineering Solutions of Sandia, LLC, where he continues to push the boundaries of imaging technology. His work has garnered attention for its innovative approach and practical applications in scientific research.
Collaborations
Johnathan has collaborated with notable colleagues, including Amber Lynn Dagel and Andrew E Hollowell, contributing to a dynamic and innovative work environment.
Conclusion
Johnathan Mulcahy-Stanislawczyk exemplifies the spirit of innovation through his contributions to imaging technology. His patent reflects a deep understanding of the complexities involved in imaging systems and showcases his commitment to advancing the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
