Albuquerque, NM, United States of America

John Russell Kabler

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Russell Kabler. Retrieved from https://idiyas.com/inventor/john-russell-kabler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: John Russell Kabler: Innovator in Optical Measurement Technology

Introduction

John Russell Kabler is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique method and system for optical distance and angle measurement.

Latest Patents

Kabler holds a patent for a "Method and system for optical distance and angle measurement." This invention provides a contactless precision method for measuring the position of a moveable object, including its bending, torque, and rotational velocity. The system utilizes a plurality of optical sensors strategically placed around the object to transmit and receive optical signals. These signals are processed using non-linear estimation techniques to obtain accurate measurements.

Career Highlights

John Russell Kabler is currently employed at Honeywell International Inc., where he continues to work on innovative projects. His expertise in optical measurement systems has positioned him as a valuable asset to the company.

Collaborations

Kabler has collaborated with notable coworkers, including Steven D Martinez and William Mark Blevins. Their combined efforts contribute to the advancement of technology in their field.

Conclusion

John Russell Kabler's work in optical measurement technology exemplifies innovation and precision. His contributions have the potential to impact various industries that rely on accurate measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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