The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2002

Filed:

Dec. 30, 1999
Applicant:
Inventors:

Steven D. Martinez, Corrales, NM (US);

William Mark Blevins, Albuquerque, NM (US);

John Russell Kabler, Albuquerque, NM (US);

Lonny Wayne Rakes, Rio Rancho, NM (US);

Jeffrey Norman Schoess, Buffalo, MN (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/34 ;
U.S. Cl.
CPC ...
G01D 5/34 ;
Abstract

A contactless precision, optical distance and angle measurement method and system optically measuring the position of a moveable object, the bending of the object, the torque applied to the object and the object's rotational velocity. The present invention includes a plurality of optical sensors placed around and adjacent to the moveable object which transmit optical signals to a surface of the object and receives the optic signals when predefined marker means are sensed. The received optic signals are then processed by non-linear estimation techniques known to those of skill in the art to obtain the desired information.


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