County of Centre, United Kingdom

John M Cuffe

This inventor holds 1 USPTO granted patent. Top assignee: Krautkramer Branson, Inc.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John M Cuffe. Retrieved from https://idiyas.com/inventor/john-m-cuffe-u6ovo3im

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Innovations of John M Cuffe in Ultrasonic Measurement Technology

Introduction

John M Cuffe is an accomplished inventor based in the County of Centre, GB. He has made significant contributions to the field of ultrasonic measurement technology. His innovative approach has led to the development of a unique apparatus designed for measuring the physical properties of tubes.

Latest Patents

John M Cuffe holds a patent for a high-resolution measurement technique utilizing ultrasound. The patent describes an apparatus that includes a pulse generator, transducers, and receivers to accurately measure the thickness of a tube. The system generates an ultrasonic waveform that propagates through the tube, capturing echoes that are processed to determine various physical characteristics. This technology allows for real-time evaluation and precise measurement of the time of flight, ensuring accurate results.

Career Highlights

Cuffe is associated with Krautkramer Branson, Inc., where he applies his expertise in ultrasonic technology. His work has been instrumental in advancing measurement techniques that are crucial for various industrial applications. With a focus on innovation, he continues to contribute to the field through his research and development efforts.

Conclusion

John M Cuffe's contributions to ultrasonic measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to precision and efficiency in measuring physical properties, showcasing the importance of advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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