The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1997
Filed:
Dec. 07, 1994
John M Cuffe, County of Centre, GB;
Krautkramer-Branson, Inc., Lewistown, PA (US);
Abstract
Apparatus (10) for measuring physical properties of a tube (T). A pulse generator (12) generates an electrical pulse having predetermined characteristics. Transducers (20a, 20b) convert the pulse to an ultrasonic waveform (W) and propagate the waveform at the tube from different directions. Resulting echoes (E1-E3) are converted into electrical response pulses. Another transducer (24a) propagates a similar waveform at a reference object (B) and converts an echo therefrom into a reference electrical response pulse which is combined with each of the other response pulses. Receivers (28a, 28b) receive the combined response pulses and convert them to digital data stored in a memory (32). A processor (36) reconstructs each combined waveform and determines from each reconstruction a value representing a physical characteristic of the tube. This involves performing a 'real time' evaluation of the combined waveform to determine if it meets threshold criteria. If it does, a linear interpolation and finite impulse response on the digital data is performed to precisely measure time of flight (TOF). A processor (54) mathematically combines respective TOF values derived from a reconstruction to ascertain other physical characteristics of the tube. Each characteristic value is compared with a predetermined set of limits to determine if a measured value fall within the limits. Results of the comparison are displayed to an operator, and a permanent record of the values is made.