New Providence, NJ, United States of America

John J Puttress

This inventor holds 1 USPTO granted patent. Top assignee: Lucent Technologies Inc.. Active years: 1997.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 66(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Innovations by John J Puttress

Introduction

John J Puttress is an accomplished inventor based in New Providence, NJ (US). He has made significant contributions to the field of technology, particularly in the area of code analysis. His innovative approach has led to the development of a unique method that enhances the understanding of code similarities.

Latest Patents

John J Puttress holds a patent for a "Method of identifying similarities in code segments." This method involves analyzing multiple code segments to determine their similar static and dynamic features. The process includes extracting predetermined static attributes from each code segment and running them to ascertain their dynamic attributes. A distance function is then computed based on these attributes, providing a measurement of similarity between the code segments. This innovation is crucial for improving code analysis and optimization.

Career Highlights

Throughout his career, John has worked with Lucent Technologies Inc., where he has applied his expertise in technology and innovation. His work has contributed to advancements in software development and code analysis, making him a valuable asset in his field.

Collaborations

John has collaborated with notable colleagues, including Jonathan Isaac Helfman and James R Rowland. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

John J Puttress is a notable inventor whose work in code analysis has paved the way for advancements in technology. His patent reflects his commitment to innovation and his ability to solve complex problems in the field.

Profile summary based on public USPTO records.
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