The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1997

Filed:

Jan. 17, 1995
Applicant:
Inventors:

James E Goodnow, II, Grass Valley, CA (US);

Jonathan Isaac Helfman, Gillette, NJ (US);

Thaddeus Julius Kowalski, Summit, NJ (US);

John J Puttress, New Providence, NJ (US);

James R Rowland, Short Hills, NJ (US);

Carl Robert Seaquist, Auburn, AL (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518314 ;
Abstract

A method of analyzing a plurality of code segments to determine the similar static and dynamic features of the code segments compares the static and dynamic features of each of the code segments. Each code segment is comprised of one or more lines of program instructions. One or more predetermined static attributes are extracted from each code segment. Each code segment is then run so that the dynamic attributes of the code segment can be determined. The dynamic attributes are extracted from each code segment and a distance function is computed which is based on the extracted static and dynamic attributes for a given pair of code segments. The distance function produces a distance measurement which indicates the relative degree of similarity between the given pair of code segments.


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