This inventor holds 1 USPTO granted patent. Top assignee: Agilent Technologies, Inc.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: John J Kuhn: Innovator in RF Spectrum Measurement
Introduction
John J Kuhn is a notable inventor based in Santa Rosa, CA (US). He has made significant contributions to the field of RF spectrum measurement, particularly with his innovative patent that addresses GSM applications. His work is essential for enhancing the accuracy and efficiency of RF measurements in telecommunications.
Latest Patents
Kuhn holds a patent for an RF output spectrum measurement analyzer and method. This invention provides a comprehensive approach to measuring RF spectrum, specifically tailored for GSM applications. The method involves acquiring an RF carrier signal, converting it to an IF signal, and then to a digital signal of wide bandwidth. It employs FFT filtering to measure multiple offset frequencies within the IF bandwidth, applying a resolution bandwidth filter at each offset. This innovative approach allows for precise measurements and analysis of RF signals.
Career Highlights
John J Kuhn is associated with Agilent Technologies, Inc., where he has contributed to advancements in RF technology. His expertise in spectrum measurement has positioned him as a valuable asset in the field. With a focus on improving measurement techniques, Kuhn's work has implications for various telecommunications applications.
Collaborations
Kuhn has collaborated with Joseph Michael Gorin, further enhancing the innovative efforts within his field. Their partnership has likely contributed to the development of advanced technologies in RF measurement.
Conclusion
John J Kuhn's contributions to RF spectrum measurement through his innovative patent demonstrate his commitment to advancing telecommunications technology. His work continues to influence the industry, ensuring more accurate and efficient RF measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile