The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Nov. 24, 1998
John J Kuhn, Santa Rosa, CA (US);
Joseph M. Gorin, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
The present invention provides an RF spectrum measurement analyzer and method and more particularly to a GSM output RF spectrum measurement analyzer and corresponding method. One preferred embodiment of the present invention is applicable to GSM applications. However, other embodiments could be applicable to the general class of Time Division Multiple Access (TDMA) signals of which GSM, PDC (Pacific Digital Cellular), NADC and the like are a part. According to one preferred embodiment of the present invention, the method includes the steps of acquiring an RF carrier signal; converting the acquired RF carrier signal to an IF signal; converting the IF signal to a digital signal of relatively wide bandwidth; FFT filtering the digital signal to measure multiple offset frequencies within the IF bandwidth; and mathematically applying a resolution bandwidth filter at each offset. A further embodiment includes the steps of inverse FFT filtering the output of the resolution bandwidth filter and measuring the power in the time domain.